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  4. LNA module reliability testing for the MetOp second generation satellites
 
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2016
Conference Paper
Title

LNA module reliability testing for the MetOp second generation satellites

Abstract
The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (Vband) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.
Author(s)
Kärkkäinen, M.
Kantanen, M.
Alanne, A.
Viitanen, J.
Jukkala, P.
Rösch, M.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Leuther, Arnulf  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Perichaud, M.-G.
Kangas, V.
Mainwork
9th Global Symposium on Millimeter-Waves (GSMM 2016) & 7th ESA Workshop on Millimetre-Wave Technology and Applications  
Conference
Global Symposium on Millimeter Waves (GSMM) 2016  
Workshop on Millimetre-Wave Technology and Applications 2016  
DOI
10.1109/GSMM.2016.7500334
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • millimeter wave integrated circuits

  • MIMIC

  • MMIC´s

  • low noise amplifiers

  • millimeter wave transistors

  • integrated circuit reliability

  • reliability engineering

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