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  4. Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions
 
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2022
Conference Paper
Title

Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions

Abstract
Motivated by the threats of malicious modification and piracy arising from worldwide distributed supply chains, the goal of RESEC is the creation, verification, and optimization of a complete reverse engineering process for integrated circuits manufactured in technology nodes of 40nm and below. Building upon the presentation of individual reverse engineering process stages, this paper connects analysis efforts and yields with their impact on hardware security, demonstrated on a design with implemented experimental hardware Trojans. We outline the interim stage of our research activities and present our future targets linking chip design and physical verification processes.
Author(s)
Lippmann, B.
Infineon Technologies AG
Bette, A.-C.
Infineon Technologies AG
Ludwig, M.
Infineon Technologies AG
Mutter, J.
Infineon Technologies AG
Baehr, J.
Technische Universität München  
Hepp, A.
Technische Universität München  
Gieser, Horst  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Kovac, Nicola
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Zweifel, Tobias
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Rasche, M.
Raith GmbH
Kellermann, O.
Raith GmbH
Mainwork
Design, Automation & Test in Europe Conference & Exhibition, DATE 2022. Proceedings  
Project(s)
Systeme und Methoden für die Analyse und Rekonstruktion höchstintegrierter Sicherheitsschaltungen  
Funder
Bundesministerium für Bildung und Forschung -BMBF-  
Conference
Design, Automation & Test in Europe Conference & Exhibition 2022  
DOI
10.23919/DATE54114.2022.9774610
Language
English
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Keyword(s)
  • Hardware Reverse Engineering

  • Hardware Trojans

  • Image Processing

  • Layout Extraction

  • RISC-V

  • SEM Imaging

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