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  4. Plasma etching for industrial in-line processing of c-si solar cells
 
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2004
Presentation
Title

Plasma etching for industrial in-line processing of c-si solar cells

Title Supplement
Presentation held at the 19th European Photovoltaic Solar Energy Conference
Abstract
Thinner wafers and the reduction of breakage losses make it attractive for solar cell manufacturers to use in-line production systems. Closing the gap between diffusion and in-line silicon nitride deposition systems a plasma etching system has been designed suitable for a throughput of 1000 wafer/h with an automated transport system. Different plasma sources appropriate for etching large areas were tested and etch rates of around 13 µm/min for saw damage removal could be reached with sufficient homogeneity. For phosphorous glass (PSG) removal selectivities between PSG and silicon above 10 could be achieved with a CF4/C2H4 etch gas mixtures with sufficient PSG etch each rates of around 80 nm/min. Solar cells processed with the plasma PSG removal step show slightly decreased efficiencies attributed to the plasma induced damage to the emitter layer and the silicon bulk. Further process optimization is needed to reduce this damage.
Author(s)
Rentsch, Jochen  
Emanuel, Gernot  
Schetter, Christian
Aumann, T.
Theirich, D.
Gentischer, J.
Roth, K.
Fritzsche, M.
Dittrich, K.-H.
Preu, Ralf  
Conference
European Photovoltaic Solar Energy Conference 2004  
File(s)
Download (204.26 KB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-347423
Language
English
Fraunhofer-Institut für Solare Energiesysteme ISE  
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