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  4. Profiling IEC 61850. Explained on a practical example of ENTSO-E
 
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2015
Presentation
Title

Profiling IEC 61850. Explained on a practical example of ENTSO-E

Title Supplement
Presentation held at DistribuTECH Conference & Exhibition, San Diego, California, 03-05 February 2015
Author(s)
Brunner, Christoph
Huon, Gregory
Naumann, André
Conference
DistribuTECH Conference & Exhibition 2015  
File(s)
Download (1.99 MB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-393079
Language
English
Fraunhofer-Institut für Fabrikbetrieb und -automatisierung IFF  
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