• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Dependence of lead chalcogenide diode laser radiation on lattice misfit induced stress
 
  • Details
  • Full
Options
1990
Journal Article
Title

Dependence of lead chalcogenide diode laser radiation on lattice misfit induced stress

Other Title
Abhängigkeit der Frequenz der Laseremission vom Gitterfehlanpassungsstreß bei Bleichalkogenidlasern
Abstract
Lead chalcogenide diode lasers were fabricated with PbSe as active layer and different confinement layers consisting of PbS, (PbEu)Se and (PbSr)Se. For PbS confinement layers a red shift in the emission frequency was found, for the other confinement layer types a blue shift was observed. These shifts can be explained by lattice misfit induced strain.
Author(s)
Böttner, H.
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Schießl, U.
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Tacke, M.
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Schießl, U.
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Journal
Superlattices and Microstructures  
DOI
10.1016/0749-6036(90)90121-M
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Bleichalkogenid

  • diode laser

  • Diodenlaser

  • Gitterfehlanpassung

  • laser radiation

  • Laserstrahlung

  • lead chalcogenide

  • misfitstress

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024