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  4. Inline surface analysis through combined evaluation of scattering and geometric properties: exemplary possibilities for integration in bipolar plate production
 
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2025
Conference Paper
Title

Inline surface analysis through combined evaluation of scattering and geometric properties: exemplary possibilities for integration in bipolar plate production

Abstract
In this work, we demonstrate the application of camera-based laser-surface triangulation as a robust tool for the surface inspection of bipolar plates produced through various manufacturing schemes and composed of different compound materials. The measurement system is based on a conventional triangulation setup, equipped with a 2D CCD camera and additional components to enable polarization-based evaluation. This tool extends surface topography axial resolution to µm scale while enabling the estimation of surface scattering properties. For wellknown material combinations, this information is exploited for the metrological detection of surface deviations. In this context, the reemission of light is employed to probe regions in close proximity to the measurement beam. Lastly, a strategy for integration into the production process and an outlook on applications in the field of composite materials is proposed.
Author(s)
Kläber, Leander
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Bischoff, Josephin
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Kabardiadi-Virkovski, Alexander  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Schmiedel, Karsten
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Taudt, Christopher  orcid-logo
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Baselt, Tobias  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Schmidt, Christian
Chemnitz University of Technology
Keller, Nico
Chemnitz University of Technology
Lasagni, Andrés-Fabián  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Hartmann, Peter  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Mainwork
Optical Measurement Systems for Industrial Inspection XIV  
Project(s)
SME 40-06937
Funder
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.  
Conference
Conference "Optical Measurement Systems for Industrial Inspection" 2025  
DOI
10.1117/12.3062567
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • Bipolar plates

  • process monitoring

  • surface metrology

  • dark-field scattering

  • laser metrology

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