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  4. Picosecond recombination processes in lead selenide.
 
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1992
Journal Article
Titel

Picosecond recombination processes in lead selenide.

Alternative
Pikosekunden-Rekombinations-Prozesse in Bleiselemid
Abstract
Picosecond recombination processes of photoexcited electron-hole plasma in PbSe are directly monitored by time-resolved pump-probe experiments in the wavelength range from 3 to 9 Mym. At temperatures T equal or smaller than 70 K, a rapid decrease of carrier density within 100 ps is found for excitation densities higher than 7 x 10high17 cmhighminus3. This behavior is due to recombination by stimulated emission, as is evident from comparative measurements of midinfrared luminescence spectra. At T is equal to 300 K, Auger recombination on a time scale of 2 ns is observed below the threshold of stimulated emission. The data for a carrier density of 3 x 10high18 cmhighminus3 give an Auger coefficient of c is approximately equal to 10highminus28 cmhigh6/s.
Author(s)
Klann, R.
Höfer, T.
Buhleier, R.
Elsaesser, T.
Lambrecht, A.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Zeitschrift
Applied Physics Letters
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DOI
10.1063/1.108059
Language
English
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Fraunhofer-Institut für Physikalische Messtechnik IPM
Tags
  • Auger-recombination

  • Auger-recombination

  • Bleichalkogenid

  • infrared diode laser

  • Infrarotdiodenlaser

  • lead chalcogenide

  • picosecond recombination

  • Pikosekunden-Rekombination

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