• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Picosecond recombination processes in lead selenide.
 
  • Details
  • Full
Options
1992
Journal Article
Title

Picosecond recombination processes in lead selenide.

Other Title
Pikosekunden-Rekombinations-Prozesse in Bleiselemid
Abstract
Picosecond recombination processes of photoexcited electron-hole plasma in PbSe are directly monitored by time-resolved pump-probe experiments in the wavelength range from 3 to 9 Mym. At temperatures T equal or smaller than 70 K, a rapid decrease of carrier density within 100 ps is found for excitation densities higher than 7 x 10high17 cmhighminus3. This behavior is due to recombination by stimulated emission, as is evident from comparative measurements of midinfrared luminescence spectra. At T is equal to 300 K, Auger recombination on a time scale of 2 ns is observed below the threshold of stimulated emission. The data for a carrier density of 3 x 10high18 cmhighminus3 give an Auger coefficient of c is approximately equal to 10highminus28 cmhigh6/s.
Author(s)
Klann, R.
Höfer, T.
Buhleier, R.
Elsaesser, T.
Lambrecht, A.  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Journal
Applied Physics Letters  
DOI
10.1063/1.108059
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Auger-recombination

  • Auger-recombination

  • Bleichalkogenid

  • infrared diode laser

  • Infrarotdiodenlaser

  • lead chalcogenide

  • picosecond recombination

  • Pikosekunden-Rekombination

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024