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  4. Analysis of the influences of PCB process tolerances and assembly tolerances on 60 GHz radar sensor for Radar toolkit
 
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December 5, 2023
Conference Paper
Title

Analysis of the influences of PCB process tolerances and assembly tolerances on 60 GHz radar sensor for Radar toolkit

Abstract
For radar assemblies in the frequency range above 30 GHz, process selection and management are becoming increasingly important. The influence of the manufacturing process on the quality and performance of radar assemblies receives too little attention. This starts with the choice of surface finish for the PCB, continues with the effects of manufacturing tolerances and process variations in the PCB manufacturing area, and ends with the process control of the assembly process. The paper develops a methodology for linking material selection, process influences and design with the aim of providing assembly-specific design guidelines for a design suitable for manufacturing.
Author(s)
Tschoban, Christian  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Pötter, Harald  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Becker, Lukas
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Perlwitz, Paul
TU-Berlin
Brockmann, Carsten  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Groß, Mike
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Ndip, Ivan  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Schneider-Ramelow, Martin  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Mainwork
IEEE 25th Electronics Packaging Technology Conference, EPTC 2023  
Conference
Electronics Packaging Technology Conference 2023  
DOI
10.1109/EPTC59621.2023.10457917
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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