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  4. Illumination aspects of sparse line arrays for 3D terahertz imaging
 
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2016
Conference Paper
Title

Illumination aspects of sparse line arrays for 3D terahertz imaging

Abstract
Terahertz imaging solutions for industrial non-destructive testing applications receive an increasing attention. Besides the need for real-time acquisition and image processing, 3D feature localization and large field of views of several tenths to a few meters are in the focus of interest. For this purposes sparse line arrays of transmitters (Tx) and receivers (Rx) offer an optimal approach to reduce costs, hardware complexity and potentially the required measurement time of the system, while providing a comparable imaging quality to full array based approaches. But in the presence of dominant specular reflections, sparse arrays can lead to an inhomogeneous illumination which impairs images and hampers their correct interpretation. We propose an experimentally verified method to simulative asses the design of sparse line arrays, taking in consideration the scattering characteristics of the object under test.
Author(s)
Baccouche, Bessem
Mohammadzadeh, Shiva  
Keil, Andreas  
Kahl, Matthias
Haring Bolivar, Peter
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Loeffler, Torsten
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Jonuscheit, Joachim  
Sauer-Greff, Wolfgang
Urbansky, Ralph
Friederich, Fabian  
Mainwork
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016  
Conference
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) 2016  
DOI
10.1109/IRMMW-THz.2016.7758825
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Terahertz Wave Imaging

  • Image Processing

  • Electromagnetic Wave Scattering

  • Surface Roughness

  • Submillimetre Wave Receivers

  • Nondestructive Testing

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