• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Fracture and damage evaluation in microelectronic assemblies by FEA
 
  • Details
  • Full
Options
1999
Conference Paper
Title

Fracture and damage evaluation in microelectronic assemblies by FEA

Author(s)
Auersperg, J.
Michel, B.
Mainwork
Computational modeling and simulation of materials. Proceedings of Topical Symposium I on Computational Modeling and Simulation of Materials of the Forum on New Materials of the 9th CIMTEC World Ceramics Congress  
Conference
Topical Symposium on Computational Modeling and Simulation of Materials 1998  
CIMTEC, World Ceramics Congress & Forum on New Materials 1998  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024