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  4. Inspection of Samples using a fast Millimetre Wave Scanner
 
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2011
Conference Paper
Title

Inspection of Samples using a fast Millimetre Wave Scanner

Abstract
Millimeterwaves and terahertz sensors can cover a broad field of applications ranging from production control to security scanners. The outstanding features are the transparency of many materials like textiles, paper and plastics in this frequency region, the good contrast of any humid or dense dielectric material and the capability to employ miniaturized RF systems and small antenna apertures or dielectric probes. A stand-alone-millimetre-wave-imager, SAMMY, was developed and built, to demonstrate the outstanding features of this part of the electromagnetic spectrum for material inspection.
Author(s)
Hommes, A.
Nüssler, D.
Warok, P.
Krebs, C.
Heinen, S.
Essen, H.
Mainwork
Sensors & their applications XVI  
Conference
Sensors and their Applications Conference 2011  
Open Access
DOI
10.1088/1742-6596/307/1/012033
Language
English
Fraunhofer-Institut für Hochfrequenzphysik und Radartechnik FHR  
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