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  4. TSV modeling considering signal integrity issues
 
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2010
Conference Paper
Title

TSV modeling considering signal integrity issues

Abstract
Since a TSV has a metal-insulator-semiconductor structure, it supports three fundamental modes namely, skineffect, slow-wave and dielectric quasi-TEM mode. In this contribution, we predict the frequency range of these modes, considering TSVs for interposer applications as an example. Furthermore, the impact of Si-resistivity on signal integrity is quantified and coaxial TSV configurations are proposed to minimize this impact.
Author(s)
Ndip, I.
Curran, B.
Löbbicke, K.
Guttowski, S.
Reichl, H.
Lang, K.-D.
Mainwork
43rd International Symposium on Microelectronics, IMAPS 2010  
Conference
International Symposium on Microelectronics (IMAPS) 2010  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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