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  4. Evaluation of Few-Shot Learning Algorithms, Training Methods, Backbones and Learning Task for Crack Detection in Manufacturing
 
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2024
Conference Paper
Title

Evaluation of Few-Shot Learning Algorithms, Training Methods, Backbones and Learning Task for Crack Detection in Manufacturing

Abstract
Ensuring the structural integrity of components in manufacturing is paramount, with crack detection being a critical aspect of quality control. Traditional methods, which rely on either extensive labeled datasets or manual inspection, are both time-consuming and prone to human error. This study explores the application of few-shot learning (FSL) for crack detection to address these issues by utilizing minimal labeled data to train robust models. We compare the performance of models using episodic learning and transfer learning, along with inductive and transductive algorithms, using a Convolutional Neural Network (CNN) backbone for tasks involving crack detection and pseudo training. Our results show that transfer learning outperforms episodic learning, using novel data for validation during training producing the best-performing models. Furthermore, our findings suggest that limited labeled data is more effective than a large amount of unlabeled data.
Author(s)
Mehta, Dharmil Rajesh
Fraunhofer-Institut für Arbeitswirtschaft und Organisation IAO  
Omri, Safa
Fraunhofer-Institut für Arbeitswirtschaft und Organisation IAO  
Renner, Niclas
Fraunhofer-Institut für Arbeitswirtschaft und Organisation IAO  
Schaeffer, Kristian
Fraunhofer-Institut für Arbeitswirtschaft und Organisation IAO  
Neuhüttler, Jens  
Fraunhofer-Institut für Arbeitswirtschaft und Organisation IAO  
Schniertshauer, Johannes
AUDI AG
Mainwork
23rd IEEE International Conference on Machine Learning and Applications, ICMLA 2024. Proceedings  
Conference
International Conference on Machine Learning and Applications 2024  
DOI
10.1109/ICMLA61862.2024.00070
Language
English
Fraunhofer-Institut für Arbeitswirtschaft und Organisation IAO  
Keyword(s)
  • AI in Manufacturing

  • Crack Detection

  • Defect Detection

  • Few-shot learning

  • Quality Control

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