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  4. Improved mounting of strain sensors by reactive bonding
 
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2021
Journal Article
Titel

Improved mounting of strain sensors by reactive bonding

Abstract
Aim of this work is to improve the bond between a strain sensor and a device on which the strain shall be determined. As strain sensor, a CMOS-integrated chip featuring piezoresistive sensor elements was used which is capable of wireless energy and data transmission. The sensor chip was mounted on a standardized tensile test specimen of stainless steel by a bonding process using reactive multilayer systems (RMS). RMS provide a well-defined amount of heat within a very short reaction time of a few milliseconds and are placed in-between two bonding partners. RMS were combined with layers of solder which melt during the bonding process. Epoxy adhesive films were used as a reference bonding process. Under mechanical tensile loading, the sensor bonded with RMS shows a linear strain sensitivity in the whole range of tested forces whereas the adhesive-bonded sensor has slightly nonlinear behavior for low forces. Compared to the adhesive-bonded chips, the sensitivity of the reactively bonded chips is increased by a factor of about 2.5. This indicates a stronger mechanical coupling by reactive bonding as compared to adhesive bonding.
Author(s)
Schumacher, Axel
Hans-Schickard-Gesellschaft für angewandte Forschung
Shah, Vraj
Micro Systems Engineering
Steckemetz, Stefan
SunFire
Dietrich, Georg
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Pflug, Erik
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Hehn, Thorsten
Hans-Schickard-Gesellschaft für angewandte Forschung
Knappmann, Stephan
Hans-Schickard-Gesellschaft für angewandte Forschung
Dehe, Alfons
Hans-Schickard-Gesellschaft für angewandte Forschung / Albert-Ludwig-Universität Freiburg
Leson, Andreas
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Zeitschrift
Journal of materials engineering and performance
Funder
Bundesministerium für Wirtschaft und Energie BMWi (Deutschland)
Thumbnail Image
DOI
10.1007/s11665-021-05993-w
Language
English
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Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Tags
  • joining

  • strain sensor

  • sensor mounting

  • semiconductor

  • reactive multilayers

  • reactive bonding

  • nanomaterials

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