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2008
Journal Article
Title

Modellierung optischer Messprozesse

Title Supplement
Untersuchung der Interferenzmikroskopie mittels Simulationen
Other Title
Modelling of optical measurement methods. Analysis of interference microscopy via simulations
Abstract
This paper presents the findings of the project "virtual interference microscope". A simulation environment for optical measurement systems, especially for interference microscopes based on white-light interferometry, was designed at the Fraunhofer IPT. A raytracing module is basis for these simulations. This module maps the physical and optical path lengths. With this simulation environment the effects of external influences on the measurement result can by analyzed.
Author(s)
Schmitt, Robert  
Koerfer, Friedel
Bichmann, Stephan
Journal
Technisches Messen : TM  
DOI
10.1524/teme.2008.0832
Language
German
Fraunhofer-Institut für Produktionstechnologie IPT  
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