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  4. The influence of NiSn intermetallics on the performance of flip chip contacts using a low cost electroless nickel bumping approach
 
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1996
Conference Paper
Title

The influence of NiSn intermetallics on the performance of flip chip contacts using a low cost electroless nickel bumping approach

Author(s)
Jung, E.
Giebler, R.
Klöser, J.
Dietrich, L.
Zakel, E.
Reichl, H.
Kasulke, P.
Ostmann, A.
Mainwork
International Electronics Packaging Conference 1996. Proceedings  
Conference
International Electronics Packaging Conference 1996  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keyword(s)
  • ageing

  • automotive electronics

  • electroless deposition

  • environmental degradation

  • flip-chip devices

  • gold

  • integrated circuit interconnections

  • integrated circuit packaging

  • integrated circuit reliability

  • laminate

  • mechanical testing

  • microassembling

  • multichip module

  • nickel

  • nickel alloys

  • Soldering

  • tin alloys

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