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  4. C2.1 - Sensor-Intelligence Devices (SID) for Optimized Condition and Process Monitoring
 
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2025
Conference Paper
Title

C2.1 - Sensor-Intelligence Devices (SID) for Optimized Condition and Process Monitoring

Abstract
In-memory computing (IMC) has gained significant attention in recent years, particularly in the context of energy-efficient sensor systems and the emerging field of ultra-low power and Tiny Machine Learning (TinyML).[3-4] In this work the capability of an SRAM memory to process Machine Learning algorithms for Sensor-Intelligence Devices (SID) could be demonstrated.
Author(s)
Becker, Kevin
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Koster, Dirk  
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Herrmann, Hans-Georg  
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Mainwork
SMSI 2025, Sensor and Measurement Science International  
Conference
Conference "Sensor and Measurement Science International" 2025  
DOI
10.5162/SMSI2025/C2.1
Additional link
Full text
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Keyword(s)
  • Machine learning processing

  • SRAM

  • compute in memory

  • mixed-signal computing

  • analog in memory-computing

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