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  4. Simulation of Interface Cracks in Microelectronic Packaging
 
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2006
Conference Paper
Title

Simulation of Interface Cracks in Microelectronic Packaging

Abstract
Increasing use under harsh environmental conditions - extreme temperatures, in particular often lead to fatigue and failure of advanced electronic packages and related systems. As a result, its thermo-mechanical reliability becomes more and more one of the most important preconditions for adopting it in industrial applications.
Author(s)
Auersperg, J.
Seiler, B.
Cadalen, E.
Dudek, R.
Michel, B.
Mainwork
Fracture of Nano and Engineering Materials and Structures. Book + CD-ROM  
Conference
European Conference on Fracture (ECF) 2006  
DOI
10.1007/1-4020-4972-2_363
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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