English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Konferenzschrift
Yield improvement and defect control in Bridgman-type crystal growth with the aid of thermal modeling
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
2008
Conference Paper
Title
Yield improvement and defect control in Bridgman-type crystal growth with the aid of thermal modeling
Author(s)
Friedrich, J.
Mainwork
Crystal growth technology
Conference
International Workshop on Crystal Growth Technology 2005
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB