Pulsed laser beam identification of SEE-sensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators

A pulsed laser mapping of Digital Isolators was done. They were previously characterized with heavy ions at RADEF. During the test there was not only an identification of the regions which are sensitive to single-event effects (SEE) but it also revealed additional failure modes (i.e. high-frequency ringing and latchup) not seen during heavy ion testing. So this device was considered latchup free up to an LET of 60 MeV cm2/mg. But those effects could also be induced by highly penetrating particles and hence must be taken into account for radiation hardness assurance (RHA). In addition it was possible to measure the sensitive area for the different types of SEE at different laser energies.