Efficient 350 nm LEDs on low edge threading dislocation density AlGaN buffer layers

Improving the crystal quality of AlGaN epitaxial layers is essential for the realization of efficient III-nitride-based light emitting diodes (LEDs) with emission wavelengths below 365 nm. Here, we report on two different approaches to improve the material quality of AlGaN buffer layers for such UV-LEDs, which are known to be effective for the MOVPE growth of GaN layers. Firstly, we grew AlGaN on thin GaN nucleation islands which exhibit a threedimensional facetted structure (3D GaN nucleation). Lateral overgrowth of these islands results in a lateral bending of´dislocation lines at the growing facets. Secondly, in-situ deposited SiNx interlayers have been used as nano-masks reducing the dislocation density above the SiNx layers. Both approaches result in reduced asymmetric HRXRD w-scan peak widths, indicating a reduced edge-type dislocation density. They can be applied to the growth of AlGaN layers with an Al concentration of at least 20%, thus suitable for LEDs emitting around 350 nm. On-wafer electroluminescence measurements at 20 mA show an increase in output power by a factor of 7 and 25 for LED structures grown on 3D GaN nucleation and SiNx interlayer, respectively, compared to structures grown on a purely 2D grown low Al-content AlGaN nucleation layer. Mesa-LEDs fabricated from the LED layer sequences grown on buffers with SiNx interlayer exhibit a low forward voltage of 3.8 V at 20 mA and a maximum continuous wave (cw) output power of 12.2 mW at 300 mA.