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Flying wafer - A standardised methodology for multi-site processing Of 300 Mm wafers at research and development-sites
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2006
Conference Paper
Title
Flying wafer - A standardised methodology for multi-site processing Of 300 Mm wafers at research and development-sites
Author(s)
Frickinger, J.
Öchsner, R.
Schellenberger, M.
Pfeffer, M.
Pfitzner, L.
Ryssel, H.
Claes, M.
Bearda, T.
Renaud, D.
Danel, A.
Lering, M.
Graef, M.
Kaushik, V.
Murphy, B.
Fritzsche, M.
Walther, H.
Hury, S.
Mainwork
Information control problems in manufacturing. Proceedings volume from the 12th IFAC conference, INCOM 2006
Conference
Symposium on Information Control Problems in Manufacturing 2006
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB