2018
Poster
Title

Large-area layer counting of 2D materials via visible reflection spectroscopy

Title Supplement
Poster presented at IMC19, 19th International Microscopy Congress, September 9 - 14, 2018, Sydney, Australia
Author(s)
Hutzler, Andreas
Lehrstuhl für Elektronische Bauelemente, Friedrich-Alexander-Universität Erlangen-Nürnberg
Matthus, C.D.
Dolle, C.
Rommel, Mathias  orcid-logo
Jank, M.P.M.  
Spiecker, E.
Frey, L.
Funder
Conference
File(s)
Rights
Use according to copyright law
DOI
Language
English
Keyword(s)