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  4. Reliability of MEMS devices in shock and vibration overload situations
 
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2008
Conference Paper
Title

Reliability of MEMS devices in shock and vibration overload situations

Abstract
This contribution describes the investigation of the reasons for overload failure and overload reaction based on linear vibration theory by decomposition of the complex reaction into resonant mode reactions and on observation of the reaction. An impulse specific peak deflection (ISPD) is derived as a general characteristic property of a certain shock. It is applicable to predict the mechanical deflection of a certain resonant mode of an arbitrary resonant frequency due to a shock. This is further analyzed and proofed by scanning Laser Doppler interferometer (SLDI) measurement on the example of a Fabry Perot interferometer based tunable infrared filter. The results from ISPD prediction are compared to SLDI measurements and to finite element analysis results.
Author(s)
Kurth, S.
Shaporin, A.
Hiller, K.
Kaufmann, C.
Gessner, T.
Mainwork
Reliability, packaging, testing, and characterization of MEMS/MOEMS VII  
Conference
Conference on Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS 2008  
Photonics West 2008  
MOEMS-MEMS Micro-Nano Fabrication Symposium 2008  
DOI
10.1117/12.763617
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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