Compensation Techniques for Inductive-Distorted Measurements of Fast Transients in Double Pulse Test

Accurately determining the dynamic losses in Wide Band Gap (WBG) power semiconductors using the Double Pulse Test (DPT) requires a precise measurement of electrical quantities while maintaining minimal impact on the circuit layout. Shunt resistors are commonly employed due to their high bandwidth
and relatively low influence on the commutation loop. However, parasitic inductance in shunt resistors introduces errors in the measurement, impacting the accuracy of the characterization of the dynamic behavior. This paper presents a novel post-processing technique to compensate for the inductive effects
of shunt resistors by leveraging detailed sensor knowledge. An average error compensation method is developed and optimized for use in DPT setups. The proposed method is validated through circuit simulations, demonstrating its effectiveness in improving measurement accuracy and ensuring a reliable
characterization of the dynamic performance for WBG semiconductors.