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  4. Assembly of an aperture plate system for projection mask-less lithography
 
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2006
Conference Paper
Titel

Assembly of an aperture plate system for projection mask-less lithography

Abstract
Mask-less lithography becomes more and more important to reduce cycle time and lithography costs for device prototyping and small batch ASIC manufacturing. A European consortium is developing an electron multi beam technology - called projection mask-less lithography (PML2)-for the 45 nm, 32 nm node and beyond. The multi beam blanking device (programmable "aperture plate system"-APS) is one of the challenging key elements of PML2 [H.-J. Döring et al., Proc. SPIE 5751 (2005); C. Brandstätter et al., Proc. SPIE 5835 (2005)]. This paper will focus on the precision assembly concept and the alignment procedure of the aperture plate system. Major system specifications and their influence on the sub-µm assembly and alignment accuracy will be discussed in the context of mechanical, thermal and magnetic constraints.
Author(s)
Mohaupt, M.
Eberhardt, R.
Damm, C.
Peschel, T.
Tünnermann, A.
Haugeneder, E.
Döring, H.-J.
Brandstätter, C.
Hauptwerk
31st International Conference on Micro- and Nano-Engineering 2005. Proceedings
Konferenz
International Conference on Micro- and Nano-Engineering (MNE) 2005
Thumbnail Image
DOI
10.1016/j.mee.2006.01.069
Language
English
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Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Tags
  • adjustment

  • alignment

  • aperture plate system

  • assembly

  • flexure hinge

  • mark detection

  • projection mask-less lithography

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