Characterization of a Ni/C multilayer with Fluorescence XAFS experiments at fixed standing wave field positions
Alternative
Charakterisierung von Ni/C Multischichten mit Fluoreszenz XAFS-Experimenten für stehende Wellenfelder mit fester Phasenlage
Abstract
A ninefold amorphous Ni/C multilayer was characterised by X-ray reflectometry and fluorescence XAFS (X-ray Absorption Fine Structure) combined in one experiment. Synchrotron Radiation and a standing wave field which occurs for reflection at the first Bragg reflection order of the multilayer have been used. A defined shift of the standing wave field position leads to different weights of absorption and hence fluorescence contributions of the atoms within the layer. To a certain degree thus it is possible to determine the neighbourhood of the Ni-atoms in dependence of their depth position within the Ni layer.
