Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities
The characterization of nonidealities in a CP-PLL is a challenge in modeling and simulation. In general the CP-PLL is implemented in a transistor-level simulation platform, including all nonidealities and parasitic effects. Due to the low-frequency and the high-frequency part of the CP-PLL, the simulation at transistor-level is time and computer resource consuming. Because of the triggered nature of the mixed-signal CP-PLL the event-driven model is an efficient modeling technique. In this paper an enhanced event-driven model is investigated, considering some typical nonidealities. This model allows an efficient analysis and characterization of the nonideality-effects. All results are validated by a transistor-level simulation.