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  4. Highly reproducible and defect-free MOVPE overgrowth of InGaAsP-based DFB gratings
 
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1997
Journal Article
Title

Highly reproducible and defect-free MOVPE overgrowth of InGaAsP-based DFB gratings

Abstract
The paper reports on a study aiming to develop a highly reproducible process for the MOVPE overgrowth of first-order gratings made by reactive ion etching in InGaAsP. MOVPE parameters were elaborated, which guarantee both nearly perfect preservation of the gratings and an almost defect-free surface of the regrown InP layer. Whereas the former goal calls for a low growth temperature, the latter was found to be achievable only above a critical growth temperature depending on the growth rate adjusted. As a good compromise, a regrowth starting temperature of 550 degrees C and an extremely high V/III ratio in the initial stage of regrowth have been chosen. Furthermore, a well-adjusted concentration of AsH3 has been added during the heat-up cycle.
Author(s)
Franke, D.
Roehle, H.
Journal
Journal of Crystal Growth  
Conference
International Conference on Metalorganic Vapor Phase Epitaxy (ICMOVPE) 1996  
DOI
10.1016/S0022-0248(96)00548-9
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • diffraction gratings

  • distributed feedback lasers

  • gallium arsenide

  • gallium compounds

  • iii-v semiconductors

  • indium compounds

  • semiconductor epitaxial layers

  • semiconductor growth

  • semiconductor lasers

  • sputter etching

  • surface structure

  • vapour phase epitaxial growth

  • movpe overgrowth

  • dfb gratings

  • reactive ion etching

  • growth temperature dependence

  • growth rate dependence

  • v iii ratio

  • 450 to 650 c

  • InP-InGaAsP

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