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1997
Journal Article
Title
Highly reproducible and defect-free MOVPE overgrowth of InGaAsP-based DFB gratings
Abstract
The paper reports on a study aiming to develop a highly reproducible process for the MOVPE overgrowth of first-order gratings made by reactive ion etching in InGaAsP. MOVPE parameters were elaborated, which guarantee both nearly perfect preservation of the gratings and an almost defect-free surface of the regrown InP layer. Whereas the former goal calls for a low growth temperature, the latter was found to be achievable only above a critical growth temperature depending on the growth rate adjusted. As a good compromise, a regrowth starting temperature of 550 degrees C and an extremely high V/III ratio in the initial stage of regrowth have been chosen. Furthermore, a well-adjusted concentration of AsH3 has been added during the heat-up cycle.
Keyword(s)
diffraction gratings
distributed feedback lasers
gallium arsenide
gallium compounds
iii-v semiconductors
indium compounds
semiconductor epitaxial layers
semiconductor growth
semiconductor lasers
sputter etching
surface structure
vapour phase epitaxial growth
movpe overgrowth
dfb gratings
reactive ion etching
growth temperature dependence
growth rate dependence
v iii ratio
450 to 650 c
InP-InGaAsP