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2024
Conference Paper
Title
Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Abstract
What you learned in the tutorial ■ Difference between Artificial Intelligence, Machine Learning and Deep Learning ■ Concept and basic approach of machine learning workflow ■ Distinguish between supervised, unsupervised and reinforcement learning ■ Models for supervised and unsupervised learning especially Neural Networks and Convolutional neural networks ■ 4+ Case Studies that cover the field of machine learning in failure analysis ■ What next? ■ There are several packages and tutorials that cover the field of machine learning.
Mainwork
Conference Proceedings from the International Symposium for Testing and Failure Analysis
Conference
50th International Symposium for Testing and Failure Analysis Conference, ISTFA 2024