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Testability analysis for test generation in synchronous sequential circuits
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1994
Conference Paper
Title
Testability analysis for test generation in synchronous sequential circuits
Author(s)
Wolber, R.
Gläser, U.
Vierhaus, H.T.
Mainwork
IEEE International Conference on Computer Design: VLSI in Computers and Processors. Proceedings
Conference
International Conference on Computer Design, VLSI in Computers and Processors (ICCD) 1994
DOI
10.1109/ICCD.1994.331924
Language
English
AIS
