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  4. Model-based design of measurement systems
 
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2005
Conference Paper
Title

Model-based design of measurement systems

Abstract
The efficiency of the design of new measurement and test equipment can be improved substantially by computer-aided design, particularly by using tools for simulation and optimization. Modeling of the entire system comprising the device under test (DUT), the measurement instrument and signal processing agorithms allow system level simulation. Using simulation suitable measuring quantities can be selected, signal processing algorithms can be developed and different system concepts can be tested by dedicated modification of DUT model parameters. A similar method is known from electronics as "virtual test". In this paper we describe the use of simulation tools as MATLAB/SIMULINK and SystemC-AMS within the design of two measurement systems.
Author(s)
Schneider, P.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Eichler, Uwe  orcid-logo
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Einwich, K.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Schwarz, P.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Mainwork
SENSOR 2005. 12th international conference. Proceedings  
Conference
Sensor-Kongress 2005  
Language
English
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Keyword(s)
  • SystemC AMS

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