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  4. Characteristics of 1.5 µm InGaAs/InGaAsP MQW lasers
 
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1990
Conference Paper
Title

Characteristics of 1.5 µm InGaAs/InGaAsP MQW lasers

Abstract
The paper discusses long-wave MQW lasers for emissions in the range of 1.23 to 1.55 µm which have been produced as conventional InAsP/InP double heterostructures and the reasons for their relatively limited performance. The authors describe the technology of an alternative structure in which the InGaAs quantum wells are embedded in a InGaAsP material. Broad-area lasers using the ridge-guide principle are made and tested. The MQW separate confinement lasers have threshold current of 450 and 610 A/cm2 for 4 and 8 wells respectively, notably less than those of the best conventional heterostructures.
Author(s)
Duser, H.
Fidorra, F.
Franke, D.
Mohrle, M.
Rosenzweig, M.
Wolfram, P.
Grutzmacher, D.
Mainwork
Heterostruktur-Bauelemente  
Conference
Informationstechnische Gesellschaft (Fachtagung) 1990  
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • gallium arsenide

  • gallium compounds

  • iii-v semiconductors

  • indium compounds

  • semiconductor junction lasers

  • broad area lasers

  • semiconductors

  • long-wave mqw lasers

  • ridge-guide principle

  • mqw separate confinement lasers

  • threshold current

  • 1.23 to 1.55 micron

  • InGaAs-InGaAsp multiquantum well lasers

  • inasp-InP double heterostructure

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