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  4. Performance of a scaled Si gate n-well CMOS technology
 
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1981
Journal Article
Title

Performance of a scaled Si gate n-well CMOS technology

Abstract
A scaled n-well CMOS technology with 40 nm gate oxide, 1 µm PMOS and 2 µm NMOS transistors has been realised with peak effective mobilities of 710 and 260 cm2V-1s-1 for electrons and holes, respectively, and available voltage gains as high as 80 for a 1 µm PMOS and 115 for a 2 µm NMOS transistor. The corresponding maximum inverter gain was 75. The inverter supply voltage range was 1.5 to 12 V and the inverter delay time was 300 ps at 5 V supply voltage.
Author(s)
Zimmer, Günter
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Fiedler, Horst-Lothar
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Höfflinger, Bernd
Neubert, E.
Vogt, Holger
Journal
Electronics Letters  
DOI
10.1049/el:19810465
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • semiconductor devices and materials

  • metal-oxide semiconductor structures

  • metal-oxide semiconductor devices

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