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2003
Conference Paper
Title
Characterization device for diode-laser-stack beam propagation
Abstract
High beam quality can be achieved by accurate adjustment of the mechanical and microoptical components in the manufacturing process of high power diode laser stacks. A characterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization.
Author(s)