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Characterization of defects and heterogeneities in silicon nitride and silicon carbide by different NDE methods
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1980
Book Article
Title
Characterization of defects and heterogeneities in silicon nitride and silicon carbide by different NDE methods
Author(s)
Goebbels, K.
Reiter, H.
Mainwork
DARPA/AF Review of Progress in Quantitative NDE, July 8.-13.1979, La Jolla/Calif., Proceedings
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP
