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  4. Process and equipment simulation of dry silicon etching in the absence of ion bombardment
 
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1999
Journal Article
Title

Process and equipment simulation of dry silicon etching in the absence of ion bombardment

Author(s)
Otto, T.
Wolf, H.
Streiter, R.
Dehoff, A.
Wandel, K.
Gessner, T.
Journal
Microelectronic engineering  
DOI
10.1016/S0167-9317(98)00287-1
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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