Process deviations and spot defects: Two aspects of test and test development for mixed-signal circuits
Abstract
By their nature, mixed-signal circuits have to be tested for both structural integrity and parametric performance. For the example of data converters we review test pattern selection strategies geared towards structural and performance testing. We introduce a novel test pattern selection strategy that merges both objectives, and by that we achieve a significant reduction in the size of the set of test patterns applied on the production line.
