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  4. Comparative characterization of dithering schemes for denoising and performance improvement in spectral imaging interferometry
 
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2021
Conference Paper
Titel

Comparative characterization of dithering schemes for denoising and performance improvement in spectral imaging interferometry

Abstract
Noise is a main error source in low-coherence spectral imaging interferometry. Within this work, different dithering schemes are characterized for noise reduction. Additionally, the effect on interferometric profilometry is shown.
Author(s)
Taudt, Christopher
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Hartmann, Peter
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Hauptwerk
Applied Industrial Spectroscopy 2021
Konferenz
Meeting "Applied Industrial Spectroscopy" (AIS) 2021
Optical Sensors and Sensing Congress 2021
Thumbnail Image
DOI
10.1364/AIS.2021.JTh6A.22
Language
English
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Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Tags
  • interferometry

  • low-coherence interferometry

  • noise reduction

  • profilometry

  • refractive index

  • spectral imaging

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