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Patent
Title

Verfahren und Vorrichtung zur interferometrischen Untersuchung eines Messobjekts

Other Title
Interferometric investigation of measurement object involves forming measurement and reference beams in first interferometer unit, scanning object and passing reflected beams to second unit with reference beams.
Abstract
Es werden ein Verfahren und eine Vorrichtung zur interferometrischen Untersuchung eines Messobjekts (1) vorgestellt, bei denen mehrere Messstrahlen gleichzeitig ueber die Oberflaeche eines Messobjekts (1) gerastert werden. Zur Erzeugung der mehreren Messlichtbuendel (21, 22) wird Quelllichtstrahlung in verschiedenen Zonen unterschiedlich codiert, zum Beispiel ueber eine Farbcodierung, und die utnerschiedlich codierten Anteile mittels eines Lichtmodulators, zum Beispiel einer DMD-Einheit (9), gebuendelt und in der Rasterbewegung gefuehrt. Die unterschiedlich codierten Lichtanteile werden in einer Auswerteeinheit (27) getrennt voneinander und gleichzeitig ausgewertet.

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DE 10317828 B UPAB: 20041001 NOVELTY - The method involves illuminating a modulator (9) with incoherent or short coherence light with differently coded components, forming separate beams from the components and coupling into a first interferometer unit (18) to form measurement (21,22) and reference beams. The measurement beams are separately scanned over the object (1). Reflected beams are fed with reference beams to a second interferometer unit (27). Interfering components are evaluated. DETAILED DESCRIPTION - The method involves illuminating a spatial light modulator with incoherent or short coherence light with at least two differently coded components, forming separate light beams from the different components and coupling them into a first interferometer unit that forms measurement and reference beams. The measurement beams are separately scanned over the object surface. The reflected beams are fed with their reference beams to a second interferometer unit and interfering components are evaluated. AN INDEPENDENT CLAIM is also included for the following: (a) an arrangement for interferometric investigation of measurement object. USE - For interferometric investigation of measurement object. ADVANTAGE - Enables a significant increase in measurement speed.
Inventor(s)
Bai, A.
Bosbach, C.
Depiereux, F.
Link to Espacenet
http://worldwide.espacenet.com/publicationDetails/biblio?DB=worldwide.espacenet.com&locale=en_EP&FT=D&CC=DE&NR=10317828A
Patent Number
2003-10317828
Publication Date
2004
Language
German
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