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Patent
Title

Method and module for polarization analysis

Other Title
Verfahren und Vorrichtung zur Polarisationsanalyse
Abstract
It is claimed a polarization analysis module (1), preferably for quantum communication, quantum cryptography, and/or quantum key distribution (QKD), comprises a first and a second diffraction element, a wave-plate (4), and at least four single photon detectors (5), in order to enable a polarization analysis of single photons in two mutually unbiased bases and two orthogonal states per base. According to the invention, the first and second diffraction elements are polarization sensitive first and second dielectric metastructure gratings (2, 3), and the wave-plate (4) is arranged between the first and second dielectric metastructure grating (2, 3), and at least two detectors (5) are arranged in diffraction paths of the first diffraction element, and at least two detectors (5) are arranged in diffraction paths of the second diffraction element.
Inventor(s)
Steinlechner, Fabian Oliver  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Marques Muniz, André Luiz
Flügel-Paul, Thomas  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Link to:
Espacenet
Patent Number
EP4194822 A1
Publication Date
June 14, 2023
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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