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Patent
Title
Method and module for polarization analysis
Other Title
Verfahren und Vorrichtung zur Polarisationsanalyse
Abstract
It is claimed a polarization analysis module (1), preferably for quantum communication, quantum cryptography, and/or quantum key distribution (QKD), comprises a first and a second diffraction element, a wave-plate (4), and at least four single photon detectors (5), in order to enable a polarization analysis of single photons in two mutually unbiased bases and two orthogonal states per base. According to the invention, the first and second diffraction elements are polarization sensitive first and second dielectric metastructure gratings (2, 3), and the wave-plate (4) is arranged between the first and second dielectric metastructure grating (2, 3), and at least two detectors (5) are arranged in diffraction paths of the first diffraction element, and at least two detectors (5) are arranged in diffraction paths of the second diffraction element.
Patent Number
EP4194822 A1
Publication Date
June 14, 2023
Language
English