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Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Organic film formation investigated by atomic force microscopy on the nanometer scale
Quantitative Erfassung von Oberflächentopographien
AFM - Abbildung feinster Strukturen
Imaging elastic sample properties with an atomic force microscope operating in the Tapping Mode
Prepolymer film growth by adsorption out of solution on silicon and aluminium. An atomic force microscope study
AFM investigations of the initial stages of prepolymer film growth on aluminium
Comparative film thickness determination by atomic force microscopy and ellipsometry for ultrathin prepolymer films