Fraunhofer-Institut für Produktionsanlagen und Konstruktionstechnik IPK

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Patent

Vorrichtung und Verfahren zur Pruefung der Gestalt einer Oberflaeche eines zu vermessenden Objektes

1998 , Koerner, K. , Fritz, H. , Nyarsik, L. , Spur, G. , Uhlmann, E.

The description relates to a device for the topographical inspection of the surfaces of an object to be tested. The invention is characterized by the fact that it comprises the following components: - at least one light source, - at least one light-distributing surface, - at least one projection stage and - one detector for electromagnetic radiation.

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Publication

Grazing-incidence interference microscopy for the measurement of topography of fine-machined surfaces

1993 , Spur, G. , Körner, K. , Nyarsik, L. , Fritz, H. , Uhlmann, E.

A possibility for measuring the form, waviness and roughness of fine-machined surfaces by interferometric means is discussed. A variety of fine-machined surfaces shows parameters in the range of microns. So it is necessary to increase the interferometric increment in a two-beam-interferometer with visible light by grazing incidence illumination. This principle was investigated in a new prism interferometer and in a new grazing incidence microscope. Test measurements are represented and discussed.

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