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  4. Defects in High-k gate dielectric stacks. Nano-electronic semiconductor devices
 
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Title

Defects in High-k gate dielectric stacks. Nano-electronic semiconductor devices

Title Supplement
St. Petersburg, Russia, from 11 to 14 July 2005
Person Involved
Publisher
Springer  
Publishing Place
Dordrecht
Publication Date
2006
Series
NATO science series. Series 2, Mathematics, physics, and chemistry; 220
ISBN
1-402-04365-1
Conference
Advanced Research Workshop on Defects in Advanced High-k Dielectric Nano-Electronic Semiconductor Devices 2005  
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