Title

Reliability of Compound Semiconductors Digest, ROCS Workshop 2009. Proceedings

Title Supplement

October 11, 2009, Greensboro, North Carolina

Corporate Author

Joint Electron Device Engineering Council -JEDEC-, Committee on GaAs Reliability and Quality Standards

IEEE Electron Devices Society

Publisher

Publishing Place

New York, NY

Publication Date

2009

ISBN

0-7908-0124-8

978-0-7908-0124-7

Conference