Title

Sixth IEEE International Conference on Artificial Intelligence Testing, AITest 2024. Proceedings

Title Supplement

15-18 July 2024, Shanghai, China

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-

Publisher

IEEE Computer Society Conference Publishing Services (CPS)

Publication Date

2024

ISBN

979-8-3503-6506-1

979-8-3503-6505-4

DOI

10.1109/AITest62860.2024

Conference

International Conference on Artificial Intelligence Testing 2024

Acronym

AITest

Language

English