Title

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II

Title Supplement

2 - 4 August 2005, San Diego, California, USA

Person Involved

Corporate Author

Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.

Publisher

Publishing Place

Bellingham, WA

Publication Date

2005

Series

Proceedings of SPIE; 5878

ISBN

0-8194-5883-X

Conference