• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Hauptwerk
  4. 30th International Symposium for Testing and Failure Analysis 2004. Proceedings
 
  • Details
  • Publications
Options
Title

30th International Symposium for Testing and Failure Analysis 2004. Proceedings

Title Supplement
November 14 - 18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts
Corporate Author
Electronic Device Failure Analysis Society -EDFAS-, Materials Park/Ohio
Publisher
ASM International  
Publishing Place
Materials Park, Ohio
Publication Date
2004
ISBN
0-87170-807-8
Conference
International Symposium for Testing and Failure Analysis (ISTFA) 2004  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024