Title

26th International Symposium for Testing and Failure Analysis 2000. Proceedings

Title Supplement

12 - 16 November 2000, Meydenbauer Convention Center, Bellevue, Washington

Corporate Author

Electronic Device Failure Analysis Society -EDFAS-, Materials Park/Ohio

Publisher

Publishing Place

Materials Park, Ohio

Publication Date

2000

ISBN

0-87170-701-2

Conference