Title

1st International Workshop on Metamorphic Testing, MET 2016. Proceedings

Title Supplement

16 May 2016, Austin, Texas, USA

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-

Association for Computing Machinery -ACM-

Publisher

Publishing Place

Piscataway, NJ

Publication Date

2016

ISBN

978-1-4503-4163-9

978-1-5090-0130-9

1-5090-0130-1

Conference